[PDF.26al] Arithmetic Built-In Self-Test for Embedded Systems

Arithmetic Built-In Self-Test for Embedded Systems

[PDF.qu54] Arithmetic Built-In Self-Test for Embedded Systems

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 | #5236586 in Books |  1997-08 | Original language:English | PDF # 1 |  1.01 x6.34 x9.34l, | File type: PDF | 256 pages

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||0 of 0 people found the following review helpful.| good topic|By Customer|dated, but relevant for modern embedded systems.|From the Inside Flap|Preface The semiconductor industry, driven by ever-increasing demands for higher performance and reliability, as well as greater functionality and speeds, continuously introduces new higher density technologies and new integrated circuits.

This book will introduce test and design engineers to new techniques that can be used to improve testing and quality of a wide range of circuits. This book explains what arithmetic built-in self-test (BIST) is, and how it can be used in a wide variety of circuits. It shows how BIST can support new design methodologies that rely on hardware/software co-design, DSP cores and embedded processors. Hardware/embedded system designers, test engineers, ...

You can specify the type of files you want, for your device.Arithmetic Built-In Self-Test for Embedded Systems   |  Janusz Rajski, Jerzy Tyszer. A good, fresh read, highly recommended.

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