[PDF.20ya] Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering)

Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering)

[PDF.hr88] Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering)

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 |  2014-10-15 |  2014-10-15 | Original language:English | PDF # 1 |  9.25 x.31 x6.10l,.45 | File type: PDF | 124 pages

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||From the Back Cover||Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability o

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. ...

You easily download any file type for your gadget.Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering)   |  Smita Krishnaswamy, Igor L. Markov, John P. Hayes.Not only was the story interesting, engaging and relatable, it also teaches lessons.

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