[PDF.00so] Test and Diagnosis for Small-Delay Defects

Test and Diagnosis for Small-Delay Defects

[PDF.un35] Test and Diagnosis for Small-Delay Defects

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 |  2014-11-28 |  2014-11-28 | Original language:English | PDF # 1 |  9.25 x.53 x6.10l,.73 | File type: PDF | 212 pages

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||From the Back Cover|This book introduces new techniques for detecting and diagnosing small-delay defects (SDD) in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

You can specify the type of files you want, for your gadget.Test and Diagnosis for Small-Delay Defects   |  Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty. Just read it with an open mind because none of us really know.

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